System and Method for Predicting lwarx and stwcx Instructions in Test Pattern Generation and Simulation for Processor Design Verification and Validation

ABSTRACT

A system and method for predicting lwarx (Load Word And Reserve Index form) and stwcx (Store Word Conditional) instruction outcome is presented. A lwarx instruction establishes a reservation on an address/granule, and a stwcx instruction targeted to the same address/granule “succeeds” only if the reservation for the granule still exists (conditional store). Since the reservation may be lost due to situations such as, for example, a processor (or another processor) executing a different lwarx or ldarx instruction (or other mechanism), which clears the first reservation and establishes a new reservation, the invention described herein builds test patterns in a manner that ensures, stwcx success and failure predictability. As a result, stwcx instructions are testable during test pattern execution.

BACKGROUND OF THE INVENTION

1. Technical Field

The present invention relates to a system and method for predictinglwarx (Load Word And Reserve Index form) and stwcx (Store WordConditional) instruction outcome. More particularly, the presentinvention relates to a system and method for generating a test patternthat deliberately positions lwarx-stwcx pairs in a manner that causesthe stwcx instruction to succeed in one scenario and fail in anotherscenario in order to verify both scenarios.

2. Description of the Related Art

Lwarx and stwcx instructions are instruction pairs that reserve anaddress (lwarx) and store data to the reserved address (stwcx) when thereservation still exists. A challenge found, however, is that thelwarx-initiated reservation may be lost due to reasons such as aprocessor (or another processor) executing other instructions before thepaired stwcx instruction executes (e.g., lwarx, ldarx, stwcx, stdcx,etc.). As a result, the paired stwcx instruction's result isunpredictable and, therefore, difficult to test.

In addition, the memory used by the stwcx instruction is not predictableand, therefore, unknown. Any subsequent instruction using the unknownmemory leaves the instruction's result unknown. As the memory usagecontinues, a possibility exists that much memory may be left in anunknown state, which does not allow for using a CRC method for checkingresults.

What is needed, therefore, is a system and method that generateslwarx/stwcx instruction pairs such that the stwcx instruction outcome ispredictable.

SUMMARY

It has been discovered that the aforementioned challenges are resolvedusing a system and method to predict a stwcx instruction's success orfailure. A lwarx instruction establishes a reservation on anaddress/granule, and a stwcx instruction targeted to the sameaddress/granule “succeeds” only if the reservation for the granule stillexists (conditional store). Since the reservation may be lost due tosituations such as, for example, a processor (or another processor)executing a different lwarx or ldarx instruction, which clears the firstreservation and establishes a new reservation, or other mechanisms whichcause loss of reservation, the invention described herein builds testpatterns in a manner that ensures, stwcx success and failurepredictability. As a result, stwcx instructions are testable during testpattern execution.

A first test case scenario is when a test pattern generator builds atest pattern in a manner where stwcx instructions succeed. In amulti-core system it is really difficult to control other processors toaccess the same granule. To achieve this, the test pattern generatorbuilds the stwcx instruction such that it matches the previous lwarxaddress. In addition, test patterns for the other processors are builtin such a way that the processors do not access that reserved granule,which reserves the particular granule for one processor. In addition,the test pattern does not include other instructions between thelwarx-stwcx pair that may disrupt the reservation (stores, dcba, dcbst,etc.).

A second test case scenario is when a test pattern generator builds atest pattern in a manner where stwcx instructions fail. To achieve this,the test pattern generator executes the stwcx instruction on a differentaddress other than that of the paired lwarx that established thereservation. As a result, the stwcx instruction always fails and,therefore, the result is predicable and testable.

The foregoing is a summary and thus contains, by necessity,simplifications, generalizations, and omissions of detail; consequently,those skilled in the art will appreciate that the summary isillustrative only and is not intended to be in any way limiting. Otheraspects, inventive features, and advantages of the present invention, asdefined solely by the claims, will become apparent in the non-limitingdetailed description set forth below.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention may be better understood, and its numerousobjects, features, and advantages made apparent to those skilled in theart by referencing the accompanying drawings.

FIG. 1 is a diagram showing a multi-processor system using an onboardgenerator/tester for processor design verification and validation;

FIG. 2 is a diagram showing a generator/tester generating test patternsand comparing hardware results against simulation results duringprocessor design verification and validation;

FIG. 3 is a diagram showing a test pattern generator generating testpatterns based upon architectural rules and initialization information;

FIG. 4A is a diagram showing a general operating system execution modethat comprises a user mode and a kernel mode;

FIG. 4B is a diagram showing an innovative operating system executionmode;

FIG. 5 is a diagram showing a test pattern generator using a testpattern simulator to execute test patterns and compute simulation errordetection check values, which are subsequently passed to a test patternexecutor that performs error detection checks using the simulation errordetection check values and hardware error detection check values;

FIG. 6 is a diagram showing a test pattern generator providing “n” testpatterns to a plurality of test pattern executors in order to increaseoverall test time throughput;

FIG. 7 is a flowchart showing steps taken in re-executing test patternsin varying timing scenarios;

FIG. 8 is a diagram showing a test pattern generator generating testpatterns that, when executed, provides interesting test scenarios bysharing page table memory for test pattern memory;

FIG. 9 is a flowchart showing steps taken in re-executing test patternsin varying timing scenarios;

FIG. 10 is a diagram showing an L2 cache's initial state prior to a testpattern execution;

FIG. 11 is a diagram showing an L2 cache's state after executing testpatterns on a plurality of processors a first round;

FIG. 12 is a diagram showing an L2 cache's state after executing testpatterns on a plurality of processors a second round;

FIG. 13 is a diagram showing cache snoop logic and coherencyverification between an instruction cache (icache) and a data cache(dcache);

FIG. 14 is a diagram showing a processor executing multiple testpatterns on multiple threads to quickly test each entry in a translationlookaside buffer (TLB);

FIG. 15 is a diagram showing a processor executing multiple testpatterns on multiple threads to fully test an L2 cache;

FIG. 16 is a flowchart showing steps taken in testing an entire TLBmemory;

FIG. 17 is a flowchart showing steps taken in providing full testcoverage of a cache;

FIG. 18 is a flowchart showing steps taken in generating test patternsto test lwarx and stwcx instructions;

FIG. 19 is a diagram showing test pattern execution that includes pairedlwarx-stwcx instructions in a non-interrupt mode;

FIG. 20 is a table showing different test pattern execution scenariosthat result in different bus contention scenarios;

FIG. 21 is a diagram showing two processors executing two different testpatterns, which results in a particular bus timing scenario anddifferent states of functional units during execution;

FIG. 22 is a diagram showing a broadband element architecture whichincludes a plurality of heterogeneous processors capable of implementingthe invention described herein;

FIG. 23 is a block diagram illustrating a processing element having amain processor and a plurality of secondary processors sharing a systemmemory; and

FIG. 24 illustrates a simplified example of a computer system capable ofperforming the computing operations described herein.

DETAILED DESCRIPTION

The following is intended to provide a detailed description of anexample of the invention and should not be taken to be limiting of theinvention itself. Rather, any number of variations may fall within thescope of the invention, which is defined in the claims following thedescription.

FIG. 1 is a diagram showing a multi-processor system using an onboardgenerator/tester for processor design verification and validation.Multi-processor system 100 includes processor A 110, processor B 120,processor C 130, and processor D 140. As one skilled in art canappreciate, more or less processors may be used in a multi-processorsystem other than the example shown in FIG. 1 for processor designverification and validation.

Processor A 110 includes generator/tester 150, which generatespseudo-random test patterns that are distributed to each processor.Generator/tester 150 receives input from user interface 155 andretrieves architectural rules from architectural details 160 in order togenerate the pseudo-random test patterns (e.g., test pattern A 165, testpattern B 170, test pattern C 175, and test pattern D 180). Thepseudo-random test patterns fully test multi-processor 100's memory andtiming characteristics based upon the retrieved architectural rules.Architectural details 160 may be stored on a nonvolatile storage area,such as a computer hard drive.

After the processor executes the test patterns, generator/tester 150receives hardware results (e.g., results B 185, results C 190, andresults D 195) from the processors and compares the results againstsimulation results in order to ensure that multi-processor system 100operates in a manner consistent with the architectural rules (see FIG. 2and corresponding text for further details regarding generator/tester150).

FIG. 2 is a diagram showing a generator/tester generating test patternsand comparing hardware results against simulation results duringprocessor design verification and validation. Generator/tester 150includes initializer 200, test pattern generator 210, simulator 220,test pattern executor 230, and results comparator 250. User interface155 provides user input to initializer 200 and test pattern generator210, such as instruction types to execute, memory range, the number ofinstructions to build in a test pattern, etc. In turn, initializer 200provides initialization information to test pattern generator 210.Generator/tester 150 and user interface 155 are the same as that shownin FIG. 1.

Test pattern generator 210 uses the initialization information, alongwith architectural rules from architectural details 160, to generatepseudo-random test patterns for a plurality of processors. Test patterngenerator 210 provides the test patterns to simulator 220 and testpattern executor 230. Test pattern executor 230 dispatches the testpatterns to processors 240 that, in turn, execute the test patterns.Processors 240 then provide hardware results back to test patternexecutor 230. Architectural details 160 is the same as that shown inFIG. 1.

Test pattern executor 230 provides the hardware results to resultscomparator 250, which compares the hardware results with simulationresults generated by simulator 220. Results comparator 250 then informstest pattern executor 230 as to whether the hardware results match thesimulation results. In turn, test pattern executor 230 dispatches moretest patterns to processor 240 accordingly. In one embodiment, testpattern executor 230 resides on processors 240 (see FIG. 3 andcorresponding text for further details). In another embodiment, resultscomparator 250 resides within test pattern executor 230 (see FIG. 5 andcorresponding text for further details). In these embodiments, thefunctions that test pattern executor 230 and results comparator 250perform are similar to their functions described above.

FIG. 3 is a diagram showing a test pattern generator generating testpatterns based upon architectural rules and initialization information.Initializer 200 provides initialization information to test patterngenerator 210, which stores the initialization information ininstruction pool table 310, register pool manager 320, and memorymanager 330. Instruction pool table 310 includes information such as atable of different instruction classes such as VMX instructions,floating point instructions, fixed point instructions, load/storeinstructions, etc. Register pool manager 320 includes tables such asgeneral purpose registers (GPR), special purpose registers (SPR),hardware implementation registers (HID), etc. And, memory manager 330includes memory pages described by hash tables, page data structures,allocation rules, etc. Test pattern engine 300 uses the initializationinformation, along with architectural rules 340 retrieved fromarchitectural details 160, to generate pseudo-random test patterns thatare provided to processors 240. Architectural details 160, initializer200, and test pattern generator 210 are the same as that shown in FIG.2.

FIG. 4A is a diagram showing a general operating system execution modethat comprises a user mode and a kernel mode. When an operating systemperforms design verification and validation tasks, test patterngenerator 400 and a portion of test pattern executor 410 (scheduler 420and comparator 430) function in the user mode, while the remainingportion of test pattern executor 410 (dispatcher 440) functions in thekernel mode to dispatch test patterns. This results in longer test timedue to the context switch required from user mode to kernel mode.

FIG. 4B is a diagram showing an innovative operating system executionmode. FIG. 4B is different than FIG. 4A in that each module within testpattern executor 410 (scheduler 420, comparator 430, and dispatcher 440)operates in the kernel mode, while test pattern generator 400 operatesin the user mode. By performing design verification and validation usingthe mode shown in FIG. 4B, the invention described herein avoids contextswitching between user mode and kernel mode, thus reducing overall testtime.

FIG. 5 is a diagram showing a test pattern generator using a testpattern simulator to execute test patterns and compute simulation errordetection check values, such as a cyclic redundancy check (CRC), whichare subsequently passed to a test pattern executor that performs errordetection checks using the simulation error detection check values andhardware error detection check values. The configuration shown in FIG. 5may be used in various embodiments, some of which are described below.

In a first embodiment, test pattern generator 500 generates one testpattern for executing a particular number of times on a processor. Inthis embodiment, test pattern generator 500 provides the test pattern totest pattern simulator 510 that, in turn, simulates the test pattern andreturns simulation results (simulation error detection check values,such as CRC values) to test pattern generator 500. Test patterngenerator 500 then provides the test pattern, along with the simulationerror detection check values, to test pattern executor 520, whichprovides them to scheduler 530. Scheduler 530 schedules the test patternto dispatcher 540, which dispatches the test pattern to processor 550.

Continuing with the first embodiment, processor 550 executes the testpattern and provides hardware results to results comparator 570, such asa CRC comparator. Scheduler 530 instructs results comparator 570 tocompute hardware error detection check values using the hardwareresults, and perform an error detection check by comparing the hardwareerror detection check values against the simulation error detectioncheck values. In turn, results comparator 570 provides a pass/failindication to scheduler 530. If the comparison passes, test patternexecutor 520 may re-execute the same test pattern again to ensure thatthe same hardware error detection check values are computed. As aresult, since the test patterns themselves are not changed, overall testtime is significantly reduced.

In a second embodiment, test pattern generator 500 generates a set of“n” test patterns per processor for executing a particular number oftimes on a plurality of processors (see FIGS. 6, 7, and correspondingtext for further details). In this embodiment, test pattern generator500 provides the test patterns, for processor 550, to test patternsimulator 510 that, in turn, simulates the test patterns and returnssimulation results (simulation error detection check values) to testpattern generator 500. In turn, test pattern generator 500 provides thetest patterns, along with the simulation results, to test patternexecutor 520, which provides them to scheduler 530. Scheduler 530schedules one of the test patterns to dispatcher 540, which dispatchesthe test pattern to processor 550.

Continuing with the second embodiment, processor 550 executes the testpattern and provides hardware results to results comparator 570.Scheduler 530 instructs error detection check comparator 570 to computea hardware register error detection check value using the hardwareresults, and perform a register error detection check by comparing thehardware register error detection check value against the simulationregister error detection check value. If the comparison passes, testpattern executor 520 determines whether each test pattern included inthe set of test patterns has been executed. If not, scheduler 530selects a different test pattern from the set of test patterns and sendsthe test pattern to dispatcher 540 to dispatch. Once all of the testpatterns have been executed at least once, scheduler 530 instructionsresults comparator 570 to compare a hardware memory error detectioncheck value against a simulation memory error detection check value. Asa result, since a memory error detection check is not performed aftereach test pattern execution, but rather after all test patterns haveexecuted, less time is spent performing error detection checks, whichallows more time to execute test patterns.

In a third embodiment, test pattern generator 500 generates a testpattern that is independent of initial data values. In this embodiment,test pattern generator 500 provides the test pattern, along with aninitial set of data values, to test pattern simulator 510. Test patternsimulator 500 simulates the test pattern and produces a simulationresult (simulation error detection check values). Test pattern simulator510 then uses the simulation results as input values for a second testpattern execution round. Test pattern simulator 510 continues tosimulate the test pattern and use the test pattern's simulation resultsas input data values for a next simulation for a particular number oftimes. Finally, test pattern simulator 510 provides the simulationresults of all successive simulations to test pattern generator 500.

Continuing with this embodiment, once test pattern simulator 510 hassimulated the test pattern a particular number of times, test patterngenerator 500 passes the test pattern, the initial data values, and thesimulation results to test pattern executor. Test pattern executor 520uses scheduler 530 and dispatcher 540 as discussed above to schedule anddispatch the test pattern to processor 550. Processor 550 executes thetest pattern and provides hardware results to results comparator 570,which computes hardware error detection check values and compares themagainst the simulation error detection check values. If they match,scheduler 530 and dispatcher 540 dispatch the same test pattern alongwith the hardware results of previous executions to be used as initialdata values (similar to test pattern simulator 510 above). Eachexecution round has a separate simulation error detection check value.This continues for the same number of times that test pattern simulator510 re-executed the test pattern. As a result, since the same testpattern is used, less time is spent on generating test patterns, whichallows more time to execute the test patterns.

In the third embodiment test pattern generator 500 ensures that the testpatterns include known and predictable values since a test pattern mayproduce unknown values through various means. Test pattern generator 500aborts those instructions that generate architecturally unknown results.For example, floating point arithmetic instructions may set registercontents as infinity or NAN (not a number) after a few registeroperations. In addition, test pattern generator 500 generates testpatterns in a manner such that test pattern executor 520 is not requiredto change translations for every test pattern execution. For example,when executing a test pattern using different initial values, realaddress and offsets may change in real mode, which requires a change intranslation. However, test pattern generator 500 avoids the translationchange by ensuring that the same page/address is targeted in real mode.

FIG. 6 is a diagram showing a test pattern generator providing “n” testpatterns to a plurality of test pattern executors (each executing onseparate processors) in order to increase overall test time throughput.Test pattern generator 600 provides test pattern 0A 610, test pattern 1A615, test pattern 2A 620, and test pattern 3A 625 to test patternexecutor 630 and test pattern 0B 611, test pattern 1B 616, test pattern2B 621, and test pattern 3B 626 to test pattern executor 640. In turn,test pattern executor 630 dispatches the test patterns to processor A650 and test pattern executor 640 dispatches the test patterns toprocessor B 660. During execution, processor A 650 and processor B 660may communicate with each other, or retrieve information from mainmemory 680, through bus 670.

After each test pattern execution, test pattern executor 630 and testpattern executor 640 perform a register error detection check. Forexample, after processor A 650 executes test pattern 0A and processor B660 executes test pattern 0B, test pattern executor 630 and test patternexecutor 640 both compute a hardware register error detection checkvalue based upon hardware results from their respective processors, andmatch the computed values against simulation register error detectioncheck values (see FIG. 7 and corresponding text for further details).

Once processor A 650 finishes executing all of its corresponding testpatterns at least once, and processor B 660 finishes executing all ofits corresponding test patterns, test pattern executor 630 and 640 eachperforms a memory error detection check comparison against simulationvalues, and sets an error flag if the comparison values do not match(see FIG. 7 and corresponding text for further details). By waitinguntil all of the test patterns execute before performing a memory errordetection check, verification time decreases, which increases the amountof time available for test pattern execution and, therefore, increasestest coverage.

FIG. 7 is a flowchart showing steps taken in re-executing test patternsin varying timing scenarios. Processing executes a set of test patternsfor each processor and waits until each test pattern included in the setof test patterns has executed before performing a memory error detectioncheck. For example, a system may include test pattern set A and testpattern set B, which execute on processor A and processor B,respectively. In this example, each of the test pattern sets includes anumber of test patterns, such as ten test patterns. Continuing with thisexample, processing waits until all ten test patterns included in testpattern set A have executed at least once on processor A, and all tentest patterns included in test pattern set B have executed at least onceon processor B before performing a memory error detection check. As aresult, less time is spent on memory error detection checks, whichallows more time to execute test patterns (see FIG. 6 and correspondingtext for further details). In one embodiment, processing may perform amemory error detection check after “X” executions given the conditionthat each test pattern has executed at least once.

Processing commences at 700, whereupon processing builds logic andcomputes simulation error detection check values based upon simulationresults, such as simulation register error detection check values andsimulation memory error detection check values (step 710). For example,the simulation error detection check values may be computed using acyclic redundancy check (CRC). At step 720, processing selects a testpattern from a corresponding test pattern set to be executed on eachprocessor (test pattern 0A for processor A and test pattern 0B forprocessor B). Processors 725 execute the selected test patterns, andprocessing saves the execution results at step 730.

Next, processing computes a hardware register error detection checkvalue (e.g., CRC value) for each of processors 725 based upon theirexecution results (step 740), and a determination is made as to whetherthe hardware register error detection check values equal the simulationregister error detection check values (decision 750). If the hardwareregister error detection check values do not equal the simulationregister error detection check values, decision 750 branches to “No”branch 752 whereupon processing sets a global error flag (step 755) andends at 760.

On the other hand, if the hardware register error detection check valuesequal the simulation register error detection check values, decision 750branches to “Yes” branch 758 whereupon a determination is made as towhether all of the test patterns included in each test pattern set haveexecuted at least once on their respective processors (decision 765). Ifall of the test patterns have not executed at least once, decision 765branches to “No” branch 767, which loops back to select another testpattern. This looping continues until all test patterns included in eachtest pattern set have executed at least once on their respectiveprocessors, at which point decision 765 branches to “Yes” branch 769whereupon processing computes a hardware memory error detection checkvalue (e.g. CRC value) at step 770.

A determination is made as to whether the hardware memory errordetection check value matches the simulation memory detection checkvalue (decision 780). If the hardware memory error detection check valuedoes not match the simulation memory detection check value, decision 780branches to “No” branch 782 whereupon processing sets a global errorflag at step 755, and ends at 760. On the other hand, if the hardwarememory error detection check value matches the simulation memorydetection check value, decision 780 branches to “Yes” branch 788.

A determination is made as to whether to continue processor verificationat decision 790. For example, system verification may require each testpattern set to execute 100 times on its respective processor. Ifprocessor verification is to continue, decision 790 branches to “Yes”branch 792, which loops back to step 720, whereupon a test pattern fromeach of the test pattern sets is selected to execute on its respectiveprocessor. This looping continues until processor verification shouldterminate, at which point decision 790 branches to “No” branch 798whereupon processing ends at 799.

FIG. 8 is a diagram showing a test pattern generator generating testpatterns that, when executed, provide interesting test scenarios bysharing page table memory for test pattern memory (e.g., instruction anddata). A processor comprises sub units such as a cache, a TLB(translation look aside buffer), an SLB (segment look aside buffer), anMMU (memory management unit), etc. As such, Test pattern generator 800generates test patterns in order to utilize memory in manner that ismost effective for testing each of the sub units.

In addition to instruction memory, data memory is also shared acrossprocessors and test patterns. Since a processor's architectural rulesmay not specify that page table memory is restricted to only translationpurposes, the test patterns are generated in order to test conditionswhen the page table memory is used for purposes other than translation.

Test pattern generator 800 generates test pattern 0 805 and test pattern1 810, which are provided to test pattern executor 815 and test patternexecutor 820, respectively. In turn, test pattern executor 815 and testpattern executor 820 dispatch the test patterns to processor A 825 andprocessor B 840, respectively. Test pattern 0 805 and test pattern 1 810are generated such that their memory is pseudo-randomly allocated. As aresult, the memory is distributed across processors and across multipletest patterns (in a case of N test patterns per processor).

When processor A 825 executes test pattern 0 805, instruction cache 830includes “ADDR 3” and data cache 835 includes “ADDR 0” and “ADDR 1.”Similarly, when processor B 840 executes test pattern 1 810, instructioncache 845 includes “ADDR 3” and data cache 850 includes “ADDR 0” and“ADDR 2.”

As such, as can be seen in L2 cache 860, cache line 0 862 includesinformation pertaining to test pattern 0 805 as well as test pattern 1810, which is pulled from address 0 882 in main memory 880 over bus 870.Cache line 1 864 includes page table entry information that is pulledfrom address 1 884 in main memory 880. Cache line 2 866 includesinformation pertaining to test pattern 0 805 as well as test pattern 1810, which is pulled from address 2 888 in main memory 880. And, cacheline 3 868 includes information pertaining to test pattern 0 805 as wellas test pattern 1 810, which is pulled from address 3 886 in main memory880.

On many occasions, when a test pattern is generated, a page table is notfully utilized. In such cases, the test patterns utilize the unusedmemory as DATA or instruction memory. As such, when the test patternexecutes, an MMU may be updating the Page Table Entry (PTE) lines incache at the same time another processor is updating the data memory inthe same page that the PTE entry resides or accesses instruction memory.

FIG. 9 is a flowchart showing steps taken in re-executing test patternsin varying timing scenarios. The invention described herein verifies aprocessor by re-executing the same test pattern that results in the samefinal memory and register states in spite of different timing scenariosunder which the execution occurs (see FIGS. 10-12 and corresponding textfor further details).

Processing commences at 900, whereupon processing builds logic andcomputes simulation error detection check values based upon simulationresults, such as simulation register error detection check values andsimulation memory error detection check values (step 910). For example,the simulation error detection check values may be computed using acyclic redundancy check (CRC). At step 920, processing executes a testpattern on each of processors 925 (different test pattern for eachprocessor). Processing stores execution results from each of processors925 at step 930.

Next, processing computes a hardware register error detection checkvalue (e.g., CRC value) for each of processor 925 based upon theirexecution results (step 940), and a determination is made as to whetherthe hardware register error detection check values equal the simulationregister error detection check values (decision 950). If the hardwareregister error detection check values do not equal the simulationregister error detection check values, decision 950 branches to “No”branch 952 whereupon processing sets a global error flag (step 955) andends at 960.

On the other hand, if the hardware register error detection check valuesequal the simulation register error detection check values, decision 950branches to “Yes” branch 958 whereupon processing computes a hardwarememory error detection check value (e.g. CRC value) at step 970.

A determination is made as to whether the hardware memory errordetection check value matches the simulation memory detection checkvalue (decision 980). If the hardware memory error detection check valuedoes not match the simulation memory detection check value, decision 980branches to “No” branch 982 whereupon processing sets a global errorflag at step 955, and ends at 960. On the other hand, if the hardwarememory error detection check value matches the simulation memorydetection check value, decision 980 branches to “Yes” branch 988.

A determination is made as to whether to continue processor verificationat decision 790. For example, system verification may require each testpattern to execute 100 times on its respective processor. If processorverification is to continue, decision 990 branches to “Yes” branch 992,which loops back to 920, whereupon a test pattern from each of the testpattern sets is selected to execute on its respective processor. Thislooping continues until processor verification should terminate, atwhich point decision 990 branches to “No” branch 998 whereuponprocessing ends at 999.

FIG. 10 is a diagram showing an L2 cache's initial state prior to a testpattern execution. When a processor executes load-store instructionsfrom a test pattern for a first time, the processor fetches the datafrom main memory. During the next re-execution, however, some data mayalready reside in cache depending upon the cache implementation. Thisprovides different timing scenarios when a processor re-executes thesame test pattern.

In a multi-processor scenario, a test pattern can be constructed usingfalse sharing logic in which the processors do not share the same targetmemory address, but where the processors share the same cache lines inthe cache. Thus, a test pattern with the same initial state may take adifferent course en route to completion or produce a different processorstate under subsequent re-executions of the same test pattern. Even so,the processor memory and registers still result in the same final state(see FIGS. 11-12 and corresponding text for further details).

Test pattern generator 1000 generates test patterns 0 1010 and testpattern 1 1015, which are provided to test pattern executors 1020 and1025, respectively. In turn, test pattern executor 1020 dispatches testpattern 0 1010 to processor A 1030, which executes the test patternusing thread A. And, test pattern executor 1025 dispatches test pattern1 1015 to processor B 1035, which executes the test pattern using threadB. In one embodiment, a processor may not have threads, or one processormay have multiple threads. In this embodiment, each thread executes onetest pattern.

Both threads use L2 cache 1040 as they transfer information to/from mainmemory 1060 through bus 1050 during test pattern execution. Main memory1060 comprises lines X1 1062 through X4 1070 and Y1 1068 through Y31074, which include instruction and data information. Depending upontiming conditions, L2 cache 1040 will still include informationpertaining to test pattern 0 1010 and test pattern 1 1015 at the end oftheir execution (see FIGS. 11-12 and corresponding text for furtherdetails).

FIG. 11 is a diagram showing an L2 cache's state after executing testpatterns on a plurality of processors a first round. FIG. 11 is similarto FIG. 10 with the exception that processor A 1030 and processor B 1035have finished executing test pattern 0 1010 and test pattern 1 1015,respectively, for a first time.

After a first round of test pattern execution, L2 cache 1040 includesinformation in entries E0 1100 through E3 1130. Two lines “fit” intoentry 1100 during test pattern execution, which are X4 1070 (from testpattern 0 1010) and Y3 1074 (from test pattern 1 1015). As can be seen,at the end of the first test pattern execution round, Y3 1074 is pulledin first, and then X4 1070, which is why X4 1070 remains in entry 0 1100at the end of the execution. In other words, test pattern 0 1010's “loadX4” was executed after test pattern 1 1015's “store Y3.” This is due tothe fact that memory line fetching from main memory 1060 to L2 cache1040 takes few processor cycles, which results in instruction executionsequence changes across test patterns. In addition, as can be seen,entry 1 1110 includes X2 1064 information, entry 2 1120 includes Y21072's information, and entry 3 1130 includes information from both X11062 and Y1 1068. Therefore, during the next test pattern executionround, this information is not pulled from main memory 1060 because italready resides in L2 cache 1040, thus creating a different timingscenario.

FIG. 12 is a diagram showing an L2 cache's state after executing testpatterns on a plurality of processors a second round. FIG. 12 is similarto FIG. 11 with the exception that processor A 1030 and processor B 1035have executed test pattern 0 1010 and test pattern 1 1015, respectively,for a second time.

After the second round of test pattern execution, L2 cache 1040 includesinformation in entries E0 1100 through E3 1130. At the end of the secondround, however, Y3 1074 remains in E0 1100. This is due the fact thatduring the second test pattern execution round, X4 1070 is pulled in toentry E0 1100 first, and then Y3 1074. As a result, Y3 1074 remains inentry 0 1100 at the end of the second test pattern execution round, thuscreating a different timing scenario for a third execution round.

FIG. 13 is a diagram showing cache snoop logic and coherencyverification between an instruction cache (icache) and a data cache(dcache). In general, test patterns use different cache lines forinstructions and data even when they share the same page of memory. Assuch, a specific cache line may not reside in both instruction and datacaches at the same time. In order to test the L1 instruction and datalevel coherency, the invention described herein simultaneously uses thesame cache line as part of both icache 1350 and dcache 1360, both ofwhich reside within processor 1340.

Instruction stream 1300 includes instructions that correspond toparticular cache lines within L2 cache 1370, such as entry Y 1305, entryZ 1310, and entry X 1315. As can be seen, entry X 1315 corresponds tomultiple instruction lines due to the fact that each entry (cache line)is larger than a single instruction.

Instruction stream 1300 includes branch instruction 1320, which branchesto instruction 1330. By branching, instruction stream 1300 creates aninstruction stream “hole” in entry X 1315 between instruction 1320 andinstruction 1330. The instruction stream hole is an area within theinstruction stream that is not currently utilized due to a branchinstruction, which allows the invention described herein the ability tostore data in memory corresponding to the instruction stream hole(discussed below).

When processor 1340 begins executing instruction 1330, processor 1340pulls in the corresponding instruction line located in entry 1315 intoicache line 1355 (located in icache 1350). In order to completeinstruction 1330, processor 1340 also pulls in entry X 1315 into dcache1360 at dcache line 1365 because the instruction is to store data in alocation included in entry X 1315 (address 0X1024). Processor 1340executes instruction 1330, which requires changes to data line 1365since instruction 1330 targets an address location within the data line.However, data line 1365 is suppose to include the same information asicache line 1355 since they correspond to the same cache line. Whensnoop logic functions properly, the snoop logic identifies thediscrepancy between icache line 1355 and dcache line 1365 and, as aresult, icache 1350 invalidates icache line 1355 and retrieves a newupdated line that includes the changes made when executing instruction1330.

FIG. 14 is a diagram showing a processor executing multiple testpatterns that were generated in a manner to quickly test each entry in atranslation lookaside buffer (TLB). Test patterns are generated in orderto ensure that the test patterns cover an entire TLB region. During testpattern generation, new translations are created such that thetranslation corresponds to the next TLB entry in order for entire TLBcoverage until each entry in TLB 1450 is occupied (see FIG. 16 andcorresponding text for further details). As can be seen, when processor1400 invokes thread 0 1410 and thread 1 1430 to execute test pattern 01420 and test pattern 1 1440, respectively, entry 0 1455 and entry N1470 include translations corresponding to test pattern 0 1420 and entry1 1460 and entry 2 1465 include translations corresponding to testpattern 1 1440.

FIG. 15 is a diagram showing a processor executing multiple testpatterns on multiple threads to fully test an L2 cache. Processor 1500includes L2 cache 1550 that “holds” recently visited data andinstructions, and is “close” to processor 1500's core for performancepurposes. Typically, more than one unit (e.g., load/store unit, MMUetc.) accesses L2 cache 1550. In addition, threads usually share thesame on-chip cache, such as thread 0 1510 and thread 1 1530. As such, L2cache 1550 plays a crucial role in processor performance and, therefore,L2 cache 1550 verification is essential. The invention described hereinprovides an efficient way of testing each of L2 cache 1550's cachebyte/sector/word, as well as coherency, when more than one unit (MMU,processor, threads, etc.) compete for a cache line.

When more than one thread accesses a cache, the invention describedherein implements “false sharing” in order for two different threads toshare the same cache line, but different bytes/sectors/words within thesame cache line. Similarly, to stress the coherency and create a racecondition, page table memory and data memory are enabled for sharing sothat an MMU (for page table) and a processor (for data) access the samecache line at the same time.

During execution, test pattern 0 1520 accesses one unit of a cache line(byte/half word/word) and test pattern 1 1540 accesses a different unitof the same cache line. In other words, the test patterns share thecache line but not the same unit (byte/word/sector). In turn, more bytesare covered in a less amount of time since they are false shared. As canbe seen, entry 0 1555, entry 1 1560, and entry N 1570 includeinformation pertaining to both test pattern 0 1520 and test pattern 11540. Entry 1 1560 includes information corresponding to test pattern 11540.

In addition, coherency and race condition tests are performed. For thesetests, page table memory and data memory are shared between units.Therefore, both the MMU and the processor access the same cache linesimultaneously. For example, the MMU may access the cache line forupdating register/control bits and the processor may access the cacheline to update data.

The embodiment shown in FIG. 15 is an embodiment where L2 cache 1550 isnot shared between multiple processors. In another embodiment, however,multiple processors may share L2 cache 1550, which results in more testpatterns covering L2 cache 1550.

FIG. 16 is a flowchart showing steps taken in testing an entire TLBmemory. The invention described herein creates new translationscorresponding to unoccupied TLB entries until each entry is occupied inorder to provide full test coverage of the TLB. As those skilled in theart can appreciate, FIG. 16 represents building both data andinstruction translations.

Processing commences at 1600, whereupon processing randomly picks aninstruction from the set/pool of instructions defined by architecturaldetails for the processor to include in a test pattern (step 1610). Adetermination is made as to whether the instruction is a load/storeinstruction (decision 1620). If the unit is not a load/storeinstruction, decision 1620 branches to “No” branch 1622 whereuponprocessing builds the instruction at step 1660.

On the other hand, if the instruction is a load/store instruction,decision 1620 branches to “Yes” branch 1628 whereupon a determination ismade as to whether the TLB is full (decision 1630). If the TLB is full,signifying that the TLB is fully covered, decision 1630 branches to“Yes” branch 1632 whereupon processing selects any effective address andtranslation to build the load/store instruction at step 1635, and buildsthe instruction at step 1660.

On the other hand, if the TLB is not full, decision 1630 branches to“No” branch 1638 whereupon processing calls a memory manager to providean effective address for which a translation does not currently exist(step 1640). At step 1650, processing builds a new translation using theprovided address, which loads into the next empty TLB entry. At step1660, processing then builds the load/store instruction.

A determination is made as to whether to continue to create the testpattern (decision 1670). If processing should continue to create thetest pattern, decision 1670 branches to “Yes” branch 1672 which loopsback to randomly pick and process another instruction. This loopingcontinues until processing should terminate test pattern generation, atwhich point decision 1670 branches to “No” branch 1678 whereuponprocessing provides the test pattern to a test pattern executor (step1680), and processing ends at 1690.

FIG. 17 is a flowchart showing steps taken in providing full testcoverage of a cache. Processing commences at 1700, whereupon processingrandomly selects an instruction from a set/pool of instructions toinclude in a test pattern at step 1710. The set/pool of instructions aredefined based upon architectural details of a particular processor. Adetermination is made as to whether the instruction is a load/storeinstruction (decision 1720). If the instruction is not a load/storeinstruction, decision 1720 branches to “No” branch 1722 whereuponprocessing builds the instruction at step 1760.

On the other hand, if the instruction is a load/store instruction,decision 1720 branches to “Yes” branch 1728 whereupon processing calls amemory manager to provide an address for the load/store instruction(step 1730). A determination is made as to whether the byte/word/sectorcorresponding to the address is already used by another instruction(decision 1740). If the byte/word/sector is not already used, decision1740 branches to “No” branch 1742 whereupon processing builds theinstruction using the supplied address at step 1760.

On the other hand, if the byte is already used by another instruction,decision 1740 branches to “Yes” branch 1748 whereupon a determination ismade as to whether the cache is completely covered (decision 1750). Ifthe cache is not completely covered (bytes still empty), decision 1750branches to “No” branch 1752, which loops back to call the memorymanager to provide a different address. This looping continues until thecache is completely covered, at which point decision 1750 branches to“Yes” branch 1758 whereupon processing builds the instruction using theprovided address at step 1760.

A determination is made as to whether to continue test patterngeneration (decision 1770). If test pattern generation should continue,decision 1770 branches to “Yes” branch 1772, which loops back to selectand process another instruction. This looping continues until processingshould terminate test pattern generation, at which point decision 1770branches to “No” branch 1778 whereupon processing ends at 1780.

FIG. 18 is a flowchart showing steps taken in generating test patternsto test lwarx (Load Word And Reserve Index form) and stwcx (Store WordConditional) instructions. A lwarx instruction establishes a reservationon an address/granule, and a stwcx instruction targeted to the sameaddress/granule “succeeds” only if the reservation for the granule stillexists (conditional store). Since the reservation may be lost due tosituations such as, for example, a processor (or another processor)executing a another lwarx or ldarx (Load Double Word And Reserve Indexform) instruction, which clears the first reservation and establishes anew reservation, the invention described herein builds test patterns ina manner that ensures, stwcx success/failure predictability. As aresult, stwcx instructions are testable during test pattern execution(see FIG. 19 for further details).

Processing commences at 1800, whereupon processing randomly selects aninstruction from a set/pool of instructions to include in a test patternat step 1810. The set/pool of instructions are defined based uponarchitectural details of a particular processor. A determination is madeas to whether the selected instruction is a lwarx instruction (decision1820). A lwarx instruction creates a reservation in the processor foruse by a stwcx instruction. If a reservation exists and the storagelocation specified by the stwcx is the same as that specified by theLoad and Reserve instruction lwarx that established the reservation, thedata is stored at the address by the stwcx instruction and thereservation is cleared. Otherwise, the reservation is cleared and nostore is performed. If the selected instruction is a lwarx instruction,decision 1820 branches to “Yes” branch 1822 whereupon processing selectsa random address/granule that is not used by another store instructionfor the lwarx instruction (step 1825), and reserves the selectedaddress/granule for an upcoming paired stwcx instruction and marks itunusable by any other store instruction, other processor, or mechanism(step 1830).

On the other hand, if the selected instruction is not a lwarxinstruction, decision 1820 branches to “No” branch 1828 whereupon adetermination is made as to whether the selected instruction is a dcbainstruction, a dcbz instruction, or a dcbst instruction. A dcba (datacache block allocate) instruction, a dcbz (data cache block to zeros)instruction, and a dcbst (data cache block to main storage) instructionare all types of cache management instructions. If the selectedinstruction is a dcba instruction, a dcbz instruction, or a dcbstinstruction, decision 1840 branches to “Yes” branch 1842 whereuponprocessing identifies whether a paired lwarx-stwcx is in process ofbeing built and, if so, processing selects an address/granule other thanthe granule reserved by the lwarx instruction. If no paired lwarx-stwcxis being built, processing selects an address/granule withoutlimitations and builds the instruction (step 1845).

On the other hand, if the selected instruction is not a dcba, dcbz, ordcbst instruction, decision 1840 branches to “No” branch 1848 whereupona determination is made as to whether the selected instruction is astwcx instruction (decision 1850). If the selected instruction is not astwcx instruction, decision 1850 branches to “Yes” branch 1852 whereuponprocessing, if the stwcx is paired with a lwarx instruction, uses anaddress/granule reserved by the paired lwarx instruction. If the stwcxinstruction is not paired with a lwarx instruction, processing selects aunique address/granule for the stwcx instruction and builds theinstruction. On the other hand, if the selected instruction is not astwcx instruction, processing branches to “No” branch 1858 whereuponprocessing builds the selected instruction type.

A determination is made as to whether to continue to build the testpattern (decision 1870). If processing should continue to build the testpattern, decision 1870 branches to “Yes” branch 1872, which loops backto proceed to the next instruction (step 1875), and processes theinstruction. This looping continues until processing should stopgenerating the test pattern, at which point decision 1870 branches to“No” branch 1878, whereupon processing ends at 1880.

FIG. 19 is a diagram showing test pattern execution that includes pairedlwarx-stwcx instructions in a non-interrupt mode. In non-interrupt mode,stwcx failures are tested as well as stwcx successes. Since a stwcxinstruction succeeds when a reservation exists for the particulargranule reserved by a previous lwarx instruction, two scenarios exist inwhich stwcx success is predictable.

The first scenario is a “success case.” A success case is when a stwcxinstruction is built to succeed and has to be predicted forsuccess/fail. In a multi-core system, difficulty arises when controllingother processors to access the same granule. To achieve this, the stwcxinstruction is built such that it matches a previous lwarxaddress/granule. Other processors' test patterns are built in such a waythat other processors cannot access that reserved granule. As a result,the granule is reserved for a particular core. In addition, no otherinstructions (stores, dcba, dcbst, etc.) are built in between alwarx-stwcx instruction pair and, therefore, the stwcx instruction isbuilt to succeed. Since the system is in a non-interrupt mode, nocontext switch occurs while executing the test pattern. Therefore, thestwcx instruction succeeds because the reservation is not lost. As such,the result is predictable.

The second scenario is a “failure case” when a stwcx instruction isdesigned to always fail, which still results in a predictable scenario.In order to achieve this predictable scenario, the stwcx instructionalways executes on a different address/granule other than that of thepaired lwarx instruction that established the reservation.

Test pattern 1900 includes instructions 1910 through 1930. Instructions1910 and 1920 are paired with each other (first scenario), whileinstruction 1930 is not paired with any lwarx instruction (secondscenario). As test pattern 1900 executes instruction 1910, instruction1910 reserves location X 1950 in main memory 1940 for paired stwcxinstruction 1920. As such, instruction 1920 performs a successful storeinto location X 1950. In contrast, instruction 1930 is not able to storeinformation into location Y 1960 because it is not previously reservedby a paired lwarx instruction.

FIG. 20 is a table showing different test pattern execution scenariosthat result in different bus contention scenarios. In a multi-processorscenario, processors share a front side bus and all transactions to thememory flow on the bus in which a bus arbiter determines the bus owner.As a result, bus contention exists. An arbitration algorithm, however,improves the performance of the bus. The invention described hereinprovides a method to stress the bus with different timings in a shortertimeframe by providing different memory accesses in a different order byinfluencing different cache state and TLB states using the same testpatterns. By creating multiple test patterns for a multi-processorsystem, and repeatedly executing the test patterns without rebuildingthe test patterns, enables a system to spend more time testing the busand other functional units in the processor (e.g., fixed and floatingpoint units, VMX units, load/store units, etc.) rather than buildingtest patterns.

Table 2000 includes columns 2010 through 2040 and rows 2050 through2080. Each of rows 2050 through 2080 represent a test pattern to executeon a first processor (processor A 2045), and each of columns 2010through 2040 represent a test pattern to execute on a second processor(processor B 2005). The example shown in FIG. 1 shows that four testpatterns are created (test patterns A, B, C, and D), which access thesame memory and cache lines. As one skilled in the art can appreciate,more or less test patterns may be created than what is represented inFIG. 20.

Since each test pattern accesses the same memory and cache lines, thecache and TLB states are different at any given state based upon thetest pattern sequence. Therefore, by creating different test patternsequences, different start caches result and, therefore, different bustimings result.

For example, when test pattern B is executed on processor A 2045 (row2060) and test pattern D is executed on processor B 2005 (column 2040),the row/column intersection shows that the TLB, L1, L2 and bus statescorrespond to a “B,D” state. In another example, when test pattern A isexecuted on processor A (row 2050) and test pattern C is executed onprocessor B (column 2030), the row/column intersection shows that theTLB, L1, L2 and bus states correspond to an “A,C” state. In short, byexecuting the same test patterns in a different order, different cacheand TLB states result (i.e. different bus contentions), which aretested.

FIG. 21 is a diagram showing two processors executing two different testpatterns, which results in a particular bus timing scenario anddifferent states of functional units during execution. Processor A 2100executes test pattern X 2110 and processor B 2140 executes test patternY 2150. As such, TLB 2115, SLB 2120, L1 2125, L2 2130, TLB 2155, SLB2160, L1 2165, L2 2170, and bus 2175 are in an “X, Y” state. When testpattern X 2110 executes on processor B 2140 and test pattern Y 2150executes on processor A 2100, the states of the TLB's, SLB's, L1's, L2'sand bus 2175 change to “Y, X.” As can be seen, different test patterncombinations on two processors create different timing and statescenarios on the processor units and bus. As a result, the inventiondescribed herein allows processor logic and bus testing using a limitedset of test patterns in a shorter time since numerous test patterns arenot required to be built.

FIG. 22 is a diagram showing a broadband element architecture whichincludes a plurality of heterogeneous processors capable of implementingthe invention described herein. The heterogeneous processors share acommon memory and a common bus. Broadband element architecture (BEA)2200 sends and receives information to/from external devices throughinput output 2270, and distributes the information to control plane 2210and data plane 2240 using processor element bus 2260. Control plane 2210manages BEA 2200 and distributes work to data plane 2240.

Control plane 2210 includes processing unit 2220 which runs operatingsystem (OS) 2225. For example, processing unit 2220 may be a Power PCcore that is embedded in BEA 2200 and OS 2225 may be a Linux operatingsystem. Processing unit 2220 manages a common memory map table for BEA2200. The memory map table corresponds to memory locations included inBEA 2200, such as L2 memory 2230 as well as non-private memory includedin data plane 2240.

Data plane 2240 includes Synergistic processing element's (SPE) 2245,2250, and 2255. Each SPE is used to process data information and eachSPE may have different instruction sets. For example, BEA 2200 may beused in a wireless communications system and each SPE may be responsiblefor separate processing tasks, such as modulation, chip rate processing,encoding, and network interfacing. In another example, each SPE may haveidentical instruction sets and may be used in parallel to performoperations benefiting from parallel processes. Each SPE includes asynergistic processing unit (SPU) which is a processing core, such as adigital signal processor, a microcontroller, a microprocessor, or acombination of these cores.

SPE 2245, 2250, and 2255 are connected to processor element bus 2260,which passes information between control plane 2210, data plane 2240,and input/output 2270. Bus 2260 is an on-chip coherent multi-processorbus that passes information between I/O 2270, control plane 2210, anddata plane 2240. Input/output 2270 includes flexible input-output logicwhich dynamically assigns interface pins to input output controllersbased upon peripheral devices that are connected to BEA 2200.

FIG. 23 is a block diagram illustrating a processing element having amain processor and a plurality of secondary processors sharing a systemmemory. Broadband Element Architecture (BEA) 2305 includes processingunit (PU) 2310, which, in one embodiment, acts as the main processor andruns the operating system. Processing unit 2310 may be, for example, aPower PC core executing a Linux operating system. BEA 2305 also includesa plurality of synergistic processing elements (SPEs) such as SPEs 2345through 2385. Each SPE includes a synergistic processing unit (SPU) thatact as secondary processing units to PU 2310, a memory storage unit, andlocal storage. For example, SPE 2345 includes SPU 2360, MMU 2355, andlocal storage 2359; SPE 2365 includes SPU 2370, MMU 2375, and localstorage 2379; and SPE 2385 includes SPU 2390, MMU 2395, and localstorage 2399.

In one embodiment, the SPEs process data under the control of PU 2310.The SPEs may be, for example, digital signal processing cores,microprocessor cores, micro controller cores, etc., or a combination ofthe above cores. In one embodiment, each one of the local stores is astorage area associated with a particular SPU. Each SPU can configureits local store as a private storage area, a shared storage area, or anSPU's local store may be partly private and partly shared.

For example, if an SPU requires a substantial amount of local memory,the SPU may allocate 100% of its local store to private memoryaccessible only by that SPU. If, on the other hand, an SPU requires aminimal amount of local memory, the SPU may allocate 10% of its localstore to private memory and the remaining 90% to shared memory. Theshared memory is accessible by PU 2310 and by the other SPEs. An SPU mayreserve part of its local store in order for the SPU to have fast,guaranteed access to some memory when performing tasks that require suchfast access. The SPU may also reserve some of its local store as privatewhen processing sensitive data, as is the case, for example, when theSPU is performing encryption/decryption.

The MMUs are responsible for transferring data between an SPU's localstore and the system memory. In one embodiment, an MMU includes a directmemory access (DMA) controller configured to perform this function.

Each SPE may be set up to perform a different task, and accordingly, inone embodiment, each SPE may be accessed using different instructionsets. If BEA 2305 is being used in a wireless communications system, forexample, each SPE may be responsible for separate processing tasks, suchas modulation, chip rate processing, encoding, network interfacing, etc.In another embodiment, each SPE may have identical instruction sets andmay be used in parallel to perform operations benefiting from parallelprocesses.

The shared portion of the SPEs' local stores may be accessed by PU 2310as well as by the other SPEs by mapping each shared region to systemmemory 2320. In one embodiment, PU 2310 manages the memory map for thecommon system memory 2320. The memory map table may include PU 2310's L2Cache 2315, system memory 2320, as well as the SPEs' shared localstores.

A portion of system memory 2320 as shown is occupied by the operatingsystem (OS 2325). System Memory 2325 also contains data 2340, whichrepresents data to be processed by SPU 2310 as well as by the SPEs. Inone embodiment, a process executing on the PU receives a request for atask involving the processing of large data. The PU first determines anoptimum method for performing the task as well as an optimum placementof the data in common system memory 2320. The PU may then initiate atransfer of the data to be processed from disk 2335 to system memory2320. In one embodiment, the PU arranges the data in system memory 2325in data blocks the size of the registers of the SPEs. In one embodiment,the SPEs may have 128 registers, each register being 128 bits long.

The PU then searches for available SPEs and assigns blocks of data toany available SPEs for processing of the data. The SPEs can access thecommon system memory (through a DMA command, for example) transfer thedata to the SPEs' local store, and perform the assigned operations.After processing the data, the SPEs may transfer the data (using DMAagain, for example) back to common system memory 2320. This proceduremay be repeated as SPEs become available until all the data blocks havebeen processed.

FIG. 24 illustrates information handling system 2401 which is asimplified example of a computer system capable of performing thecomputing operations described herein. Computer system 2401 includesprocessor 2400 which is coupled to host bus 2402. A level two (L2) cachememory 2404 is also coupled to host bus 2402. Host-to-PCI bridge 2406 iscoupled to main memory 2408, includes cache memory and main memorycontrol functions, and provides bus control to handle transfers amongPCI bus 2410, processor 2400, L2 cache 2404, main memory 2408, and hostbus 2402. Main memory 2408 is coupled to Host-to-PCI bridge 2406 as wellas host bus 2402. Devices used solely by host processor(s) 2400, such asLAN card 2430, are coupled to PCI bus 2410. Service Processor Interfaceand ISA Access Pass-through 2412 provides an interface between PCI bus2410 and PCI bus 2414. In this manner, PCI bus 2414 is insulated fromPCI bus 2410. Devices, such as flash memory 2418, are coupled to PCI bus2414. In one implementation, flash memory 2418 includes BIOS code thatincorporates the necessary processor executable code for a variety oflow-level system functions and system boot functions.

PCI bus 2414 provides an interface for a variety of devices that areshared by host processor(s) 2400 and Service Processor 2416 including,for example, flash memory 2418. PCI-to-ISA bridge 2435 provides buscontrol to handle transfers between PCI bus 2414 and ISA bus 2440,universal serial bus (USB) functionality 2445, power managementfunctionality 2455, and can include other functional elements not shown,such as a real-time clock (RTC), DMA control, interrupt support, andsystem management bus support. Nonvolatile RAM 2420 is attached to ISABus 2440. Service Processor 2416 includes JTAG and I2C busses 2422 forcommunication with processor(s) 2400 during initialization steps.JTAG/I2C busses 2422 are also coupled to L2 cache 2404, Host-to-PCIbridge 2406, and main memory 2408 providing a communications pathbetween the processor, the Service Processor, the L2 cache, theHost-to-PCI bridge, and the main memory. Service Processor 2416 also hasaccess to system power resources for powering down information handlingdevice 2401.

Peripheral devices and input/output (I/O) devices can be attached tovarious interfaces (e.g., parallel interface 2462, serial interface2464, keyboard interface 2468, and mouse interface 2470 coupled to ISAbus 2440. Alternatively, many I/O devices can be accommodated by a superI/O controller (not shown) attached to ISA bus 2440.

In order to attach computer system 2401 to another computer system tocopy files over a network, LAN card 2430 is coupled to PCI bus 2410.Similarly, to connect computer system 2401 to an ISP to connect to theInternet using a telephone line connection, modem 2475 is connected toserial port 2464 and PCI-to-ISA Bridge 2435.

While FIG. 24 shows one information handling system that employsprocessor(s) 2400, the information handling system may take many forms.For example, information handling system 2401 may take the form of adesktop, server, portable, laptop, notebook, or other form factorcomputer or data processing system. Information handling system 2401 mayalso take other form factors such as a personal digital assistant (PDA),a gaming device, ATM machine, a portable telephone device, acommunication device or other devices that include a processor andmemory.

One of the preferred implementations of the invention is a clientapplication, namely, a set of instructions (program code) in a codemodule that may, for example, be resident in the random access memory ofthe computer. Until required by the computer, the set of instructionsmay be stored in another computer memory, for example, in a hard diskdrive, or in a removable memory such as an optical disk (for eventualuse in a CD ROM) or floppy disk (for eventual use in a floppy diskdrive), or downloaded via the Internet or other computer network. Thus,the present invention may be implemented as a computer program productfor use in a computer. In addition, although the various methodsdescribed are conveniently implemented in a general purpose computerselectively activated or reconfigured by software, one of ordinary skillin the art would also recognize that such methods may be carried out inhardware, in firmware, or in more specialized apparatus constructed toperform the required method steps.

While particular embodiments of the present invention have been shownand described, it will be obvious to those skilled in the art that,based upon the teachings herein, that changes and modifications may bemade without departing from this invention and its broader aspects.Therefore, the appended claims are to encompass within their scope allsuch changes and modifications as are within the true spirit and scopeof this invention. Furthermore, it is to be understood that theinvention is solely defined by the appended claims. It will beunderstood by those with skill in the art that if a specific number ofan introduced claim element is intended, such intent will be explicitlyrecited in the claim, and in the absence of such recitation no suchlimitation is present. For non-limiting example, as an aid tounderstanding, the following appended claims contain usage of theintroductory phrases “at least one” and “one or more” to introduce claimelements. However, the use of such phrases should not be construed toimply that the introduction of a claim element by the indefinitearticles “a” or “an” limits any particular claim containing suchintroduced claim element to inventions containing only one such element,even when the same claim includes the introductory phrases “one or more”or “at least one” and indefinite articles such as “a” or “an”; the sameholds true for the use in the claims of definite articles.

1. A computer-implemented method for generating a test pattern, themethod comprising: selecting a first lwarx instruction; pseudo-randomlyselecting a first address for the first lwarx instruction; building thefirst lwarx instruction using the first pseudo-random address into atest pattern; reserving the first pseudo-random address for a firststwcx instruction that is paired to the first lwarx instruction;selecting the first stwcx instruction; building the first stwcxinstruction into the test pattern using the first pseudo-random address,wherein a first conflicting instruction does not exist in the testpattern between the first lwarx instruction and the first stwcxinstruction.
 2. The method of claim 1 wherein the first conflictinginstruction is selected from the group consisting of a different lwarxinstruction, a different stwcx instruction, a dcba instruction, a dcbzinstruction, and a dcbst instruction.
 3. The method of claim 1 furthercomprising: executing the test pattern; checking an outcome of the firststwcx instruction; and setting an error flag if the outcome is afailure.
 4. The method of claim 1 further comprising: prior to theselection of the first pseudo-random address, detecting that the firstpseudo-random address is not allocated to a different stwcx instruction;and after the selection of the first pseudo-random address, flagging thefirst pseudo-random address for the first stwcx instruction and flaggingthe first pseudo-random address as unusable.
 5. The method of claim 1further comprising: selecting a second lwarx instruction;pseudo-randomly selecting a second address for the second lwarxinstruction; building the second lwarx instruction using the secondpseudo-random address into the test pattern; building a secondconflicting instruction using the second pseudo-random address into thetest pattern at a location after the second lwarx instruction; andbuilding a second stwcx instruction using the pseudo-random address intothe test pattern at a location after the second conflicting instruction.6. The method of claim 5 wherein the second conflicting instructionovertakes a reservation that was created by the second lwarxinstruction, the method further comprising: executing the test pattern;checking an outcome of the second stwcx instruction; and setting anerror flag if the outcome is a success.
 7. The method of claim 1 whereinthe test pattern executes in non-interrupt mode.
 8. An informationhandling system comprising: one or more processors; a memory accessibleby the processors; one or more nonvolatile storage devices accessible bythe processors; and a set of instructions stored in the memory, whereinone or more of the processors executes the set of instructions in orderto perform actions of: selecting a first lwarx instruction;pseudo-randomly selecting a first address for the first lwarxinstruction; building the first lwarx instruction using the firstpseudo-random address into a test pattern; reserving the firstpseudo-random address for a first stwcx instruction that is paired tothe first lwarx instruction; selecting the first stwcx instruction;building the first stwcx instruction into the test pattern using thefirst pseudo-random address, wherein a first conflicting instructiondoes not exist in the test pattern between the first lwarx instructionand the first stwcx instruction.
 9. The information handling system ofclaim 8 wherein the first conflicting instruction is selected from thegroup consisting of a different lwarx instruction, a different stwcxinstruction, a dcba instruction, a dcbz instruction, and a dcbstinstruction.
 10. The information handling system of claim 8 furthercomprising an additional set of instructions in order to perform actionsof: executing the test pattern; checking an outcome of the first stwcxinstruction; and setting an error flag if the outcome is a failure. 11.The information handling system of claim 8 further comprising anadditional set of instructions in order to perform actions of: prior tothe selection of the first pseudo-random address, detecting that thefirst pseudo-random address is not allocated to a different stwcxinstruction; and after the selection of the first pseudo-random address,flagging the first pseudo-random address for the first stwcx instructionand flagging the first pseudo-random address as unusable.
 12. Theinformation handling system of claim 8 further comprising an additionalset of instructions in order to perform actions of: selecting a secondlwarx instruction; pseudo-randomly selecting a second address for thesecond lwarx instruction; building the second lwarx instruction usingthe second pseudo-random address into the test pattern; building asecond conflicting instruction using the second pseudo-random addressinto the test pattern at a location after the second lwarx instruction;and building a second stwcx instruction using the pseudo-random addressinto the test pattern at a location after the second conflictinginstruction.
 13. The information handling system of claim 12 wherein thesecond conflicting instruction overtakes a reservation that was createdby the second lwarx instruction, the information handling system furthercomprising an additional set of instructions in order to perform actionsof: executing the test pattern; checking an outcome of the second stwcxinstruction; and setting an error flag if the outcome is a success. 14.A computer program product stored on a computer operable media, thecomputer operable media containing instructions for execution by acomputer, which, when executed by the computer, cause the computer toimplement a method of processing test patterns, the method comprising:selecting a first lwarx instruction; pseudo-randomly selecting a firstaddress for the first lwarx instruction; building the first lwarxinstruction using the first pseudo-random address into a test pattern;reserving the first pseudo-random address for a first stwcx instructionthat is paired to the first lwarx instruction; selecting the first stwcxinstruction; building the first stwcx instruction into the test patternusing the first pseudo-random address, wherein a first conflictinginstruction does not exist in the test pattern between the first lwarxinstruction and the first stwcx instruction.
 15. The computer programproduct of claim 14 wherein the first conflicting instruction isselected from the group consisting of a different lwarx instruction, adifferent stwcx instruction, a dcba instruction, a dcbz instruction, anda dcbst instruction.
 16. The computer program product of claim 14wherein the method further comprises: executing the test pattern;checking an outcome of the first stwcx instruction; and setting an errorflag if the outcome is a failure.
 17. The computer program product ofclaim 14 wherein the method further comprises: prior to the selection ofthe first pseudo-random address, detecting that the first pseudo-randomaddress is not allocated to a different stwcx instruction; and after theselection of the first pseudo-random address, flagging the firstpseudo-random address for the first stwcx instruction and flagging thefirst pseudo-random address as unusable.
 18. The computer programproduct of claim 14 wherein the method further comprises: selecting asecond lwarx instruction; pseudo-randomly selecting a second address forthe second lwarx instruction; building the second lwarx instructionusing the second pseudo-random address into the test pattern; building asecond conflicting instruction using the second pseudo-random addressinto the test pattern at a location after the second lwarx instruction;and building a second stwcx instruction using the pseudo-random addressinto the test pattern at a location after the second conflictinginstruction.
 19. The computer program product of claim 18 wherein thesecond conflicting instruction overtakes a reservation that was createdby the second lwarx instruction, the computer program product furthercomprising: executing the test pattern; checking an outcome of thesecond stwcx instruction; and setting an error flag if the outcome is asuccess.
 20. The computer program product of claim 14 wherein the testpattern executes in non-interrupt mode.
 21. A computer-implementedmethod comprising: generating a test pattern; simulating the testpattern using a first input data value, wherein the simulation resultsin a first simulation error detection check value; and re-simulating thetest pattern using the first simulation error detection check value as asecond input data value, wherein the re-simulation results in a secondsimulation error detection check value.
 22. The method of claim 21wherein the test pattern is independent of each of a plurality of inputdata values provided to the test pattern, wherein the first input datavalue and the second input data value are included in the plurality ofinput data values.
 23. The method of claim 22 wherein, during thegeneration of the test pattern, the method further comprises: excludingeach instruction from the test pattern that produces an unknown valuedue to any one of the plurality of input data values.
 24. The method ofclaim 21 further comprising: providing the test pattern, the first inputdata value, the first simulation error detection check value, and thesecond simulation error detection check value to a test patternexecutor; sending the first input data and the test pattern from thetest pattern executor to a processor; and executing the test pattern onthe processor using the first input data, resulting in a first hardwareerror detection check value.
 25. The method of claim 24 furthercomprising: comparing the first simulation error detection check valuewith the first hardware error detection check value; in response to thefirst simulation error detection check value matching the first hardwareerror detection check value, sending the first hardware error detectioncheck value and the test pattern to the processor; and re-executing thetest pattern on the processor using the first hardware error detectioncheck value, resulting in a second hardware error detection check value.26. The method of claim 25 further comprising: comparing the secondsimulation error detection check value with the second hardware errordetection check value; and in response to the second simulation errordetection check value matching the second hardware error detection checkvalue, invoking a pass signal.
 27. An information handling systemcomprising: one or more processors; a memory accessible by theprocessors; one or more nonvolatile storage devices accessible by theprocessors; and a set of instructions stored in the memory, wherein oneor more of the processors executes the set of instructions in order toperform actions of: generating a test pattern; simulating the testpattern using a first input data value, wherein the simulation resultsin a first simulation error detection check value; and re-simulating thetest pattern using the first simulation error detection check value as asecond input data value, wherein the re-simulation results in a secondsimulation error detection check value.
 28. The information handlingsystem of claim 27 wherein the test pattern is independent of each of aplurality of input data values provided to the test pattern, wherein thefirst input data value and the second input data value are included inthe plurality of input data values.
 29. The information handling systemof claim 28 further comprising an additional set of instructions inorder to perform actions of: excluding each instruction from the testpattern that produces an unknown value due to any one of the pluralityof input data values.
 30. The information handling system of claim 27further comprising an additional set of instructions in order to performactions of: providing the test pattern, the first input data value, thefirst simulation error detection check value, and the second simulationerror detection check value to a test pattern executor; sending thefirst input data and the test pattern from the test pattern executor toa processor; and executing the test pattern on the processor using thefirst input data, resulting in a first hardware error detection checkvalue.
 31. The information handling system of claim 30 furthercomprising an additional set of instructions in order to perform actionsof: comparing the first simulation error detection check value with thefirst hardware error detection check value; in response to the firstsimulation error detection check value matching the first hardware errordetection check value, sending the first hardware error detection checkvalue and the test pattern to the processor; and re-executing the testpattern on the processor using the first hardware error detection checkvalue, resulting in a second hardware error detection check value. 32.The information handling system of claim 31 further comprising anadditional set of instructions in order to perform actions of: comparingthe second simulation error detection check value with the secondhardware error detection check value; and in response to the secondsimulation error detection check value matching the second hardwareerror detection check value, invoking a pass signal.
 33. A computerprogram product stored on a computer operable media, the computeroperable media containing instructions for execution by a computer,which, when executed by the computer, cause the computer to implement amethod of processing test patterns, the method comprising: generating atest pattern; simulating the test pattern using a first input datavalue, wherein the simulation results in a first simulation errordetection check value; and re-simulating the test pattern using thefirst simulation error detection check value as a second input datavalue, wherein the re-simulation results in a second simulation errordetection check value.
 34. The computer program product of claim 33wherein the test pattern is independent of each of a plurality of inputdata values provided to the test pattern, wherein the first input datavalue and the second input data value are included in the plurality ofinput data values.
 35. The computer program product of claim 34 wherein,during the generation of the test pattern, the method further comprises:excluding each instruction from the test pattern that produces anunknown value due to any one of the plurality of input data values. 36.The computer program product of claim 33 wherein the method furthercomprises: providing the test pattern, the first input data value, thefirst simulation error detection check value, and the second simulationerror detection check value to a test pattern executor; sending thefirst input data and the test pattern from the test pattern executor toa processor; and executing the test pattern on the processor using thefirst input data, resulting in a first hardware error detection checkvalue.
 37. The computer program product of claim 36 wherein the methodfurther comprises: comparing the first simulation error detection checkvalue with the first hardware error detection check value; in responseto the first simulation error detection check value matching the firsthardware error detection check value, sending the first hardware errordetection check value and the test pattern to the processor; andre-executing the test pattern on the processor using the first hardwareerror detection check value, resulting in a second hardware errordetection check value.
 38. The computer program product of claim 37wherein the method further comprises: comparing the second simulationerror detection check value with the second hardware error detectioncheck value; and in response to the second simulation error detectioncheck value matching the second hardware error detection check value,invoking a pass signal.
 39. A computer-implemented method comprising:generating a first test pattern, wherein the first test pattern utilizesa first unit included in a cache line; generating a second test pattern,wherein the second test pattern utilizes a second unit included in thecache line; and simultaneously executing the first test pattern on afirst thread and the second test pattern on a second thread.
 40. Themethod of claim 39 wherein the executing is performed in a false sharingmode, the executing resulting in the first cache line includinginformation corresponding to both the first test pattern and the secondtest pattern.
 41. The method of claim 39 wherein the first unit and thesecond unit are selected from the group consisting of a byte, a sector,and a word.
 42. The method of claim 39 wherein the generation of thefirst test pattern further comprises: selecting an instruction;determining that the instruction is a load/store instruction; inresponse to determining that the instruction is a load/storeinstruction, sending a request to a memory manager to provide anaddress; receiving a first address from the memory manager; determiningwhether the first address is used by a different instruction; and inresponse to determining that the first address is not used by thedifferent instruction, building the load/store instruction using thefirst address, wherein the first address corresponds to the first unit.43. The method of claim 42 further comprising: in response todetermining that the first address is used by the different instruction,determining whether a cache that includes the cache line is completelycovered; in response to determining that the cache is not completelycovered, sending a subsequent request to the memory manager to provide adifferent address; receiving a second address from the memory manager;determining that the second address is not used by a subsequentinstruction; and in response to determining that the second address isnot used by the subsequent instruction, building the load/storeinstruction using the second address, wherein the second addresscorresponds to the first unit.
 44. The method of claim 39 wherein thefirst test pattern utilizes a first entry included in a translationlookaside buffer, and wherein the second test pattern utilizes a secondentry included in the translation lookaside buffer.
 45. The method ofclaim 44 wherein, during the simultaneous execution of the first testpattern on the first thread and the second test pattern on the secondthread, the translation lookaside buffer simultaneously includesinformation corresponding to both the first test pattern in the firstentry and information corresponding to the second test pattern in thesecond entry.
 46. The method of claim 44 wherein the cache line isincluded in a cache, and wherein the execution of the first test patternand the second test pattern test the entire cache and the entiretranslation lookaside buffer.
 47. An information handling systemcomprising: one or more processors; a memory accessible by theprocessors; one or more nonvolatile storage devices accessible by theprocessors; and a set of instructions stored in the memory, wherein oneor more of the processors executes the set of instructions in order toperform actions of: generating a first test pattern, wherein the firsttest pattern utilizes a first unit included in a cache line; generatinga second test pattern, wherein the second test pattern utilizes a secondunit included in the cache line; and simultaneously executing the firsttest pattern on a first thread and the second test pattern on a secondthread.
 48. The information handling system of claim 47 wherein theexecuting is performed in a false sharing mode, the executing resultingin the first cache line including information corresponding to both thefirst test pattern and the second test pattern.
 49. The informationhandling system of claim 47 wherein the first unit and the second unitare selected from the group consisting of a byte, a sector, and a word.50. The information handling system of claim 47 further comprising anadditional set of instructions in order to perform actions of: selectingan instruction; determining that the instruction is a load/storeinstruction; in response to determining that the instruction is aload/store instruction, sending a request to a memory manager to providean address; receiving a first address from the memory manager;determining whether the first address is used by a differentinstruction; and in response to determining that the first address isnot used by the different instruction, building the load/storeinstruction using the first address, wherein the first addresscorresponds to the first unit.
 51. The information handling system ofclaim 50 further comprising an additional set of instructions in orderto perform actions of: in response to determining that the first addressis used by the different instruction, determining whether a cache thatincludes the cache line is completely covered; in response todetermining that the cache is not completely covered, sending asubsequent request to the memory manager to provide a different address;receiving a second address from the memory manager; determining that thesecond address is not used by a subsequent instruction; and in responseto determining that the second address is not used by the subsequentinstruction, building the load/store instruction using the secondaddress, wherein the second address corresponds to the first unit. 52.The information handling system of claim 47 wherein the first testpattern utilizes a first entry included in a translation lookasidebuffer, and wherein the second test pattern utilizes a second entryincluded in the translation lookaside buffer.
 53. The informationhandling system of claim 52 wherein, during the simultaneous executionof the first test pattern on the first thread and the second testpattern on the second thread, the translation lookaside buffersimultaneously includes information corresponding to both the first testpattern in the first entry and information corresponding to the secondtest pattern in the second entry.
 54. A computer program product storedon a computer operable media, the computer operable media containinginstructions for execution by a computer, which, when executed by thecomputer, cause the computer to implement a method of processing testpatterns, the method comprising: generating a first test pattern,wherein the first test pattern utilizes a first unit included in a cacheline; generating a second test pattern, wherein the second test patternutilizes a second unit included in the cache line; and simultaneouslyexecuting the first test pattern on a first thread and the second testpattern on a second thread.
 55. The computer program product of claim 54wherein the executing is performed in a false sharing mode, theexecuting resulting in the first cache line including informationcorresponding to both the first test pattern and the second testpattern.
 56. The computer program product of claim 54 wherein the firstunit and the second unit are selected from the group consisting of abyte, a sector, and a word.
 57. The computer program product of claim 54wherein the method further comprises: selecting an instruction;determining that the instruction is a load/store instruction; inresponse to determining that the instruction is a load/storeinstruction, sending a request to a memory manager to provide anaddress; receiving a first address from the memory manager; determiningwhether the first address is used by a different instruction; and inresponse to determining that the first address is not used by thedifferent instruction, building the load/store instruction using thefirst address, wherein the first address corresponds to the first unit.58. The computer program product of claim 57 wherein the method furthercomprises: in response to determining that the first address is used bythe different instruction, determining whether a cache that includes thecache line is completely covered; in response to determining that thecache is not completely covered, sending a subsequent request to thememory manager to provide a different address; receiving a secondaddress from the memory manager; determining that the second address isnot used by a subsequent instruction; and in response to determiningthat the second address is not used by the subsequent instruction,building the load/store instruction using the second address, whereinthe second address corresponds to the first unit.
 59. The computerprogram product of claim 54 wherein the first test pattern utilizes afirst entry included in a translation lookaside buffer, and wherein thesecond test pattern utilizes a second entry included in the translationlookaside buffer.
 60. The computer program product of claim 59 wherein,during the simultaneous execution of the first test pattern on the firstthread and the second test pattern on the second thread, the translationlookaside buffer simultaneously includes information corresponding toboth the first test pattern in the first entry and informationcorresponding to the second test pattern in the second entry.